FISCHER MEASUREMENT TECHNOLOGI ES (INDIA) PVT LTD

 

New generation highly precise Gold Analyzer

Advanced top to bottom ED-XRF Machine with high-resolution Silicon Drift Detector ( SDD) .

The Goldscope SD 600  provides an alll-in-one solutions for precious metal analysis and coating thickness

measurement, Multi-Layer Thickness Measurement , Solution Analysis and Alloy composition. High resolution Silicon Drift Detector with large aperture (Ø3 mm, 118 mils) enables Goldscope SD 600 to achieve highest accuracy with a short measurement time.

 

Application

 

  • Jeweller, precious metals & dental alloys Precious Metal Analysis eg. Gold, Silver and Platinum group elements
  • Measuring coating thickness on sterling silver, rhodium finishes or gold alloys
  • Determination of complex multi layer-coating system 
  • Platinum, Yellow , white gold , Rhodium and silver 
  • Solutions for refineries, tunch assay offices and hallmarking Detection of PGM Group elements such as Iridium, Ruthenium, Osmium, Rhenium enabling an accurate precious metal analysis results.
  • Materials analysis of coatings and alloys (also thin coatings and low concentrations)

 

 

 Features

 

  • Detector :  Silicon Drift Detector ( SDD ) 20 mm ( 160 eV ) /  SDD detector with 50 mm ( 140 eV )
  • Aperture (Collimator) : 4x changeable: Ø 0.1 mm (3.9 mils), Ø 0.3 mm (11.8 mils), Ø 0.6 mm (23.6 mils), slot 0.5 x 0.15 mm (19.7 x 5.9 mils)
  • Element range : Aluminium (13) to Uranium (92) – up to 24 elements simultaneously
  • Design: Bench top unit with upward opening hood, Top to bottom X-Ray
  • Repeatability : ≤ 0.5 ‰ for gold
  • Measurement time :  15 seconds
  • DPP+ for highly precise and fast anlysis of precious metals

 

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