Advanced top to bottom ED-XRF Machine with high-resolution Silicon Drift Detector ( SDD) .
The Goldscope SD 600 provides an alll-in-one solutions for precious metal analysis and coating thickness
measurement, Multi-Layer Thickness Measurement , Solution Analysis and Alloy composition. High resolution Silicon Drift Detector with large aperture (Ø3 mm, 118 mils) enables Goldscope SD 600 to achieve highest accuracy with a short measurement time.
Application
- Jeweller, precious metals & dental alloys Precious Metal Analysis eg. Gold, Silver and Platinum group elements
- Measuring coating thickness on sterling silver, rhodium finishes or gold alloys
- Determination of complex multi layer-coating system
- Platinum, Yellow , white gold , Rhodium and silver
- Solutions for refineries, tunch assay offices and hallmarking Detection of PGM Group elements such as Iridium, Ruthenium, Osmium, Rhenium enabling an accurate precious metal analysis results.
- Materials analysis of coatings and alloys (also thin coatings and low concentrations)
Features
- Detector : Silicon Drift Detector ( SDD ) 20 mm ( 160 eV ) / SDD detector with 50 mm ( 140 eV )
- Aperture (Collimator) : 4x changeable: Ø 0.1 mm (3.9 mils), Ø 0.3 mm (11.8 mils), Ø 0.6 mm (23.6 mils), slot 0.5 x 0.15 mm (19.7 x 5.9 mils)
- Element range : Aluminium (13) to Uranium (92) – up to 24 elements simultaneously
- Design: Bench top unit with upward opening hood, Top to bottom X-Ray
- Repeatability : ≤ 0.5 ‰ for gold
- Measurement time : 15 seconds
- DPP+ for highly precise and fast anlysis of precious metals